The Microscopy Laboratory is located in Percival Stern Hall, suite 3001 and 1032. CIF staff members are available to assist users with morphological analysis of both biological and material science samples. They are also available to operate the instrumentation and to consult with researchers. This lab houses a number of common pieces of sample preparation equipment, including an ultramicrotome, a heavy-metal sputter coater, and a carbon-sublimator. Several electron microscopes are equipped with cryo-stages.
FEI Tecnai G2 F30 Twin
The Tecnai G2 F30 TWIN is a 300 kV / FEG Transmission Electron Microscope. It is a high-resolution microscope optimized for complete and versatile performance with high-tilt applications such as diffraction experiments and tomography for a cross-disciplinary laboratory such as a joint Materials Science/Life Science establishment. The relatively large pole-piece gap allows for a variety of stages and detectors to be fitted in this instrument. With its FEG source, fine probe techniques (such as STEM with an HAADF detector) can be performed with ease.
TEM Point Resolution: 0.24 nm
TEM Line Resolution: 0.144 nm
Information Limit: 0.15 nm
The Tecnai G2 TEM's are equipped with Gatan cryogenic TEM system with FEI low dose capability, the most advanced SDD EDS system, FEI's total solution for 3D imaging, FEI Eagle 4k high sensitivity CCD camera and the Windows XP operating system. In the unique Tecnai concept, all microscope components, like the electron gun, the optical elements, the vacuum system and the stage, are completely digitally controlled. The task-oriented user interface allows users to automatically recall all optimized operating conditions including lens settings, gun parameters, optical alignments, aperture alignments (optional) for all the different techniques such as TEM, STEM, CBED, Diffraction and Analysis.
A variable pressure Hitachi 3400 electron microscope was installed in 2005.
In 2005, the CIF installed a Hitachi 4800 High-resolution SEM.
The CIF Microscopy Laboratory installed a JEOL 2010 Scanning Transmission Electron Microscope (STEM) in 2001.
Multi-photon Laser Scanning Microscopy (LSM) offers images far superior to those obtainable via conventional Fluorescence Microscopy. In traditional Confocal Microscopy, a laser beam is scanned across the specimen in the X and Y dimensions, and minute apertures, placed at points confocal to the focal plane within the specimen, block emissions of other planes from detection. Thus an image of a two-dimensional plane of the sample is captured. By moving either the specimen or apertures, additional planes are collected along the z-axis, and three-dimensional representations of the sample can then be constructed. Multi-photon LSM utilizes short pulses of a lower energy laser, typically in the infra-red. Fluorophores are excited by coordinated absorption of two or more photons. The probability of a multi-photon event occurring is limited to the region very near the point of focus. Fluorescence is therefore controlled in all three dimensions, eliminating the need for the confocal apertures, and thus, increasing sensitivity. Also, the problems of photobleaching and phototoxicity are minimized.
The CIF Microscopy Laboratory installed a Zeiss LSM 510 with Inverted Microscope in January, 2003. This microscope has the following features:
Tulane University, New Orleans, LA 70118 504-865-5000 firstname.lastname@example.org